esp-idf/components/driver/test
Michael (XIAO Xufeng) 6a8aed12ee ci: partially enable ut tests for esp32c2
Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2
2022-06-02 14:23:35 +08:00
..
adc_dma_test
dac_dma_test
include/test
param_test
touch_sensor_test
CMakeLists.txt
test_adc.c
test_adc2_with_wifi.c
test_adc_common.c
test_common_spi.c
test_dac.c
test_gdma.c
test_i2c.c
test_i2s.c
test_ledc.c
test_pwm.c
test_rs485.c uart: add default source clock for all targets 2022-05-09 11:26:30 +08:00
test_rtcio.c
test_sdio.c
test_sdmmc_sdspi_init.cpp
test_spi_bus_lock.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_master.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_param.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_sio.c
test_spi_slave.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_spi_slave_hd.c ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
test_uart.c uart: add default source clock for all targets 2022-05-09 11:26:30 +08:00