kopia lustrzana https://github.com/espressif/esp-idf
20 wiersze
1.0 KiB
Markdown
20 wiersze
1.0 KiB
Markdown
# fatfs component target tests
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This directory contains tests for `fatfs` component which are run on chip targets.
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See also [test_fatfs_host](../test_fatfs_host) directory for the tests which run on a Linux host.
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Fatfs tests can be executed with different `diskio` backends: `diskio_sdmmc` (SD cards over SD or SPI interface), `diskio_spiflash` (wear levelling in internal flash) and `diskio_rawflash` (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:
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- [sdcard](sdcard/) — runs fatfs tests with an SD card over SDMMC or SDSPI interface
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- [flash_wl](flash_wl/) - runs fatfs test in a wear_levelling partition in SPI flash
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- [flash_ro](flash_ro/) - runs fatfs test in a read-only (no wear levelling) partition in SPI flash
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These test apps define:
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- test functions
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- setup/teardown routines
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- build/test configurations
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- pytest test runners
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The actual test cases (many of which are common between the test apps) are defined in the [test_fatfs_common component](test_fatfs_common/).
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