esp-idf/tools/unit-test-app/components/test_utils
Michael (XIAO Xufeng) 6a8aed12ee ci: partially enable ut tests for esp32c2
Disabled test cases are tracked in:

 IDF-4465, IDF-5045, IDF-5057, IDF-5058, IDF-5059, IDF-5060, IDF-5061, IDF-5131

- test_fatfs: IDF-5136

- test_pm: IDF-5053

- test_cache_mmu: IDF-5138

- test_partitions: IDF-5137

- test_vfs: IDF-5139

- test_freertos: IDF-5140

- test_wpa_supplicant: IDF-5046

- test_mbedtls: IDF-5141

- test_pthread: IDF-5142

- test_protocomm: IDF-5143

- test_lightsleep: IDF-5053

- test_taskwdt: IDF-5055

- test_tcp_transport: IDF-5144

- test_app_update: IDF-5145

- test_timer: IDF-5052

- test_spi: IDF-5146

- test_rtc_clk: IDF-5060

- test_heap: IDF-5167

ci: fixed issues for tests of libgcc, ets_timer, newlib

test_pm: support on C2
2022-06-02 14:23:35 +08:00
..
include
private_include
test ci: partially enable ut tests for esp32c2 2022-06-02 14:23:35 +08:00
CMakeLists.txt
Kconfig
ccomp_timer.c
ccomp_timer_impl_riscv.c
ccomp_timer_impl_xtensa.c
memory_checks.c
ref_clock_impl_rmt_pcnt.c rtc_clk: Clean up some clock related enum and macro in soc/rtc.h, replace with new ones in 2022-05-24 22:59:41 +08:00
ref_clock_impl_timergroup.c
test_runner.c
test_utils.c