sforkowany z mirror/meshtastic-firmware
319 wiersze
11 KiB
C++
319 wiersze
11 KiB
C++
/*
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* mtest - Perform a memory test
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*
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* (C) Copyright 2000
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* Wolfgang Denk, DENX Software Engineering, wd@denx.de.
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*
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* See file CREDITS for list of people who contributed to this
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* project.
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*
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* This program is free software; you can redistribute it and/or
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* modify it under the terms of the GNU General Public License as
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* published by the Free Software Foundation; either version 2 of
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* the License, or (at your option) any later version.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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* You should have received a copy of the GNU General Public License
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* along with this program; if not, write to the Free Software
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* Foundation, Inc., 59 Temple Place, Suite 330, Boston,
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* MA 02111-1307 USA
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*/
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#include "configuration.h"
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/*
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* Perform a memory test. A more complete alternative test can be
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* configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
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* loops until interrupted by ctrl-c or by a failure of one of the
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* sub-tests.
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*/
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#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
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static int mem_test(uint32_t _start, uint32_t _end, uint32_t pattern_unused)
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{
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volatile uint32_t *start = (volatile uint32_t *)_start;
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volatile uint32_t *end = (volatile uint32_t *)_end;
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volatile uint32_t *addr;
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uint32_t val;
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uint32_t readback;
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vu_long addr_mask;
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vu_long offset;
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vu_long test_offset;
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vu_long pattern;
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vu_long temp;
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vu_long anti_pattern;
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vu_long num_words;
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#ifdef CFG_MEMTEST_SCRATCH
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volatile uint32_t *dummy = (vu_long *)CFG_MEMTEST_SCRATCH;
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#else
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volatile uint32_t *dummy = start;
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#endif
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int j;
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int iterations = 1;
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static const uint32_t bitpattern[] = {
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0x00000001, /* single bit */
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0x00000003, /* two adjacent bits */
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0x00000007, /* three adjacent bits */
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0x0000000F, /* four adjacent bits */
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0x00000005, /* two non-adjacent bits */
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0x00000015, /* three non-adjacent bits */
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0x00000055, /* four non-adjacent bits */
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0xaaaaaaaa, /* alternating 1/0 */
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};
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/* XXX: enforce alignment of start and end? */
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for (;;) {
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if (ctrlc()) {
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putchar('\n');
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return 1;
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}
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printf("Iteration: %6d\r", iterations);
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iterations++;
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/*
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* Data line test: write a pattern to the first
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* location, write the 1's complement to a 'parking'
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* address (changes the state of the data bus so a
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* floating bus doen't give a false OK), and then
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* read the value back. Note that we read it back
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* into a variable because the next time we read it,
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* it might be right (been there, tough to explain to
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* the quality guys why it prints a failure when the
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* "is" and "should be" are obviously the same in the
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* error message).
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*
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* Rather than exhaustively testing, we test some
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* patterns by shifting '1' bits through a field of
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* '0's and '0' bits through a field of '1's (i.e.
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* pattern and ~pattern).
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*/
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addr = start;
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/* XXX */
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if (addr == dummy)
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++addr;
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for (j = 0; j < sizeof(bitpattern) / sizeof(bitpattern[0]); j++) {
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val = bitpattern[j];
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for (; val != 0; val <<= 1) {
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*addr = val;
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*dummy = ~val; /* clear the test data off of the bus */
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readback = *addr;
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if (readback != val) {
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printf("FAILURE (data line): "
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"expected 0x%08lx, actual 0x%08lx at address 0x%p\n",
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val, readback, addr);
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}
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*addr = ~val;
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*dummy = val;
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readback = *addr;
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if (readback != ~val) {
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printf("FAILURE (data line): "
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"Is 0x%08lx, should be 0x%08lx at address 0x%p\n",
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readback, ~val, addr);
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}
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}
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}
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/*
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* Based on code whose Original Author and Copyright
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* information follows: Copyright (c) 1998 by Michael
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* Barr. This software is placed into the public
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* domain and may be used for any purpose. However,
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* this notice must not be changed or removed and no
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* warranty is either expressed or implied by its
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* publication or distribution.
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*/
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/*
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* Address line test
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*
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* Description: Test the address bus wiring in a
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* memory region by performing a walking
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* 1's test on the relevant bits of the
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* address and checking for aliasing.
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* This test will find single-bit
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* address failures such as stuck -high,
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* stuck-low, and shorted pins. The base
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* address and size of the region are
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* selected by the caller.
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*
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* Notes: For best results, the selected base
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* address should have enough LSB 0's to
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* guarantee single address bit changes.
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* For example, to test a 64-Kbyte
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* region, select a base address on a
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* 64-Kbyte boundary. Also, select the
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* region size as a power-of-two if at
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* all possible.
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*
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* Returns: 0 if the test succeeds, 1 if the test fails.
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*
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* ## NOTE ## Be sure to specify start and end
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* addresses such that addr_mask has
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* lots of bits set. For example an
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* address range of 01000000 02000000 is
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* bad while a range of 01000000
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* 01ffffff is perfect.
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*/
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addr_mask = ((uint32_t)end - (uint32_t)start) / sizeof(vu_long);
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pattern = (vu_long)0xaaaaaaaa;
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anti_pattern = (vu_long)0x55555555;
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debug("%s:%d: addr mask = 0x%.8lx\n", __FUNCTION__, __LINE__, addr_mask);
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/*
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* Write the default pattern at each of the
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* power-of-two offsets.
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*/
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for (offset = 1; (offset & addr_mask) != 0; offset <<= 1)
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start[offset] = pattern;
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/*
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* Check for address bits stuck high.
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*/
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test_offset = 0;
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start[test_offset] = anti_pattern;
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for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
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temp = start[offset];
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if (temp != pattern) {
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printf("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
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" expected 0x%.8lx, actual 0x%.8lx\n",
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(uint32_t)&start[offset], pattern, temp);
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return 1;
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}
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}
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start[test_offset] = pattern;
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/*
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* Check for addr bits stuck low or shorted.
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*/
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for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) {
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start[test_offset] = anti_pattern;
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for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
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temp = start[offset];
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if ((temp != pattern) && (offset != test_offset)) {
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printf("\nFAILURE: Address bit stuck low or shorted @"
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" 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
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(uint32_t)&start[offset], pattern, temp);
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return 1;
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}
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}
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start[test_offset] = pattern;
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}
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/*
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* Description: Test the integrity of a physical
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* memory device by performing an
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* increment/decrement test over the
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* entire region. In the process every
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* storage bit in the device is tested
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* as a zero and a one. The base address
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* and the size of the region are
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* selected by the caller.
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*
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* Returns: 0 if the test succeeds, 1 if the test fails.
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*/
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num_words = ((uint32_t)end - (uint32_t)start) / sizeof(vu_long) + 1;
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/*
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* Fill memory with a known pattern.
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*/
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for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
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start[offset] = pattern;
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}
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/*
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* Check each location and invert it for the second pass.
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*/
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for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
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temp = start[offset];
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if (temp != pattern) {
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printf("\nFAILURE (read/write) @ 0x%.8lx:"
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" expected 0x%.8lx, actual 0x%.8lx)\n",
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(uint32_t)&start[offset], pattern, temp);
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return 1;
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}
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anti_pattern = ~pattern;
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start[offset] = anti_pattern;
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}
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/*
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* Check each location for the inverted pattern and zero it.
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*/
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for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
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anti_pattern = ~pattern;
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temp = start[offset];
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if (temp != anti_pattern) {
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printf("\nFAILURE (read/write): @ 0x%.8lx:"
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" expected 0x%.8lx, actual 0x%.8lx)\n",
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(uint32_t)&start[offset], anti_pattern, temp);
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return 1;
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}
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start[offset] = 0;
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}
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}
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}
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#else
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static int mem_test(uint32_t *_start, size_t len, bool doRead = true, bool doWrite = true)
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{
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volatile uint32_t *addr;
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volatile uint32_t *start = (volatile uint32_t *)_start;
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const volatile uint32_t *end = start + len / sizeof(uint32_t);
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uint32_t pattern = 0;
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uint32_t val;
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uint32_t readback;
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uint32_t incr;
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int rcode = 0;
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incr = 1;
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//DEBUG_MSG("memtest read=%d, write=%d\n", doRead, doWrite);
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if (doWrite) {
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//DEBUG_MSG("writing\n");
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for (addr = start, val = pattern; addr < end; addr++) {
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*addr = val;
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val += incr;
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}
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}
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if (doRead) {
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//DEBUG_MSG("reading\n");
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for (addr = start, val = pattern; addr < end; addr++) {
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readback = *addr;
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if (readback != val) {
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DEBUG_MSG("Mem error @ 0x%08X: "
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"found 0x%08lX, expected 0x%08lX\n",
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addr, readback, val);
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rcode++;
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}
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val += incr;
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}
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}
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#if 0
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/*
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* Flip the pattern each time to make lots of zeros and
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* then, the next time, lots of ones. We decrement
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* the "negative" patterns and increment the "positive"
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* patterns to preserve this feature.
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*/
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if(pattern & 0x80000000) {
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pattern = -pattern; /* complement & increment */
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}
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else {
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pattern = ~pattern;
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}
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#endif
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return rcode;
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}
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#endif
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#define TESTBUF_LEN 16384
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#include <assert.h>
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void doMemTest()
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{
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static uint32_t *testBuf;
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static int iter;
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if (!testBuf)
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testBuf = (uint32_t *)malloc(TESTBUF_LEN);
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assert(testBuf);
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if (mem_test(testBuf, TESTBUF_LEN, iter % 2 == 1, iter % 2 == 0) > 0)
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assert(0); // FIXME report error better
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iter++;
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}
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