New test case for whole memory

firmware/inc/memory.h

@@ -47,7 +47,7 @@
 #define BACKLOG_START_PAGE	0x00
 #define BACKLOG_END_PAGE	0x7f
 
-
+void mem_chip_erase(void);
 void mem_read_memory(uint32_t address, uint8_t* buffer, uint32_t length);
 void mem_write_page(uint32_t address, uint8_t* buffer, uint16_t length);
 void mem_erase_sector(uint32_t address);

firmware/src/memory.c

@@ -109,7 +109,15 @@ void _mem_wait_for_done(void)
 /**
  * Simple Commands
  */
-#define mem_chip_erase()	_mem_single_comand(MEM_OP_CHIP_ERASE)
+void mem_chip_erase(void)
+{
+  _mem_single_command(MEM_OP_WRITE_ENABLE);
+
+  _mem_single_command(MEM_OP_CHIP_ERASE);
+  _mem_wait_for_done();
+
+  _mem_single_command(MEM_OP_WRITE_DISABLE);
+}
 
 /**
  * JEDEC ID

firmware/test/tmain.c

@@ -40,6 +40,7 @@
 #include "osc8m_calib.h"
 #include "location_aprs.h"
 #include "mem_write_page.h"
+#include "mem_write_all.h"
 /* [new_tc] */