esp-idf

Historia

Adam Múdry 381d0fe032 sdmmc: add vTaskDelay to loops to prevent potential WDT trigger Also change timeout to 120 seconds in fatfs sdcard pytest to prevent failing during formatting.		2023-04-11 11:06:56 +00:00
..
main	sdspi: h2 support	2023-02-27 14:39:06 +08:00
CMakeLists.txt	…
README.md	sdspi: h2 support	2023-02-27 14:39:06 +08:00
partitions.csv	…
pytest_fatfs_sdcard.py	sdmmc: add vTaskDelay to loops to prevent potential WDT trigger	2023-04-11 11:06:56 +00:00
sdkconfig.ci.default	…
sdkconfig.ci.psram	…
sdkconfig.ci.release	…
sdkconfig.defaults	…

README.md

Supported Targets	ESP32	ESP32-C2	ESP32-C3	ESP32-C6	ESP32-H2	ESP32-S2	ESP32-S3

This test app runs a few FATFS test cases in a FAT-formatted SD card.

These tests require a development board with an SD card slot:

ESP32-WROVER-KIT
ESP32-S2 USB_OTG
ESP32-C3-DevKit-C with an SD card breakout board

The test cases are split between [sdmmc] and [sdspi]. Only a few tests are executed for sdspi, though. The app could be refactored to ensure that a similar set of tests runs for sdmmc and sdspi.

See ../README.md for more information about FATFS test apps.