esp-idf/components/esp32/test
Omar Chebib cd79f3907d gpio: Disable USB JTAG when setting pins 18 and 19 as GPIOs on ESP32C3
When `DIS_USB_JTAG` eFuse is NOT burned (`False`), it is not possible
to set pins 18 and 19 as GPIOs. This commit solves this by manually
disabling USB JTAG when using pins 18 or 19.
The functions shall use `gpio_hal_iomux_func_sel` instead of
`PIN_FUNC_SELELECT`.
2021-04-08 14:01:18 +08:00
..
CMakeLists.txt Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
component.mk
test_4mpsram.c
test_aes_sha_rsa.c AES: refactor and add HAL layer 2020-12-10 09:04:47 +00:00
test_ahb_arb.c gpio: Disable USB JTAG when setting pins 18 and 19 as GPIOs on ESP32C3 2021-04-08 14:01:18 +08:00
test_ahb_arb_asm.S Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
test_backtrace.c
test_dport.c global: Uses CCOUNT API instead of XTHAL macro 2021-01-12 16:24:23 +08:00
test_dport_xt_highint5.S
test_fastbus.c gpio: Disable USB JTAG when setting pins 18 and 19 as GPIOs on ESP32C3 2021-04-08 14:01:18 +08:00
test_fastbus_asm.S
test_fp.c Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
test_himem.c
test_sha.c unit_test: Refactor all performance tests that rely on cache compensated timer 2020-12-22 18:56:24 +11:00
test_spiram_cache_flush.c
test_tsens.c
test_unal_dma.c gpio: Disable USB JTAG when setting pins 18 and 19 as GPIOs on ESP32C3 2021-04-08 14:01:18 +08:00