Historia

Adam Múdry 976644acf6 CI: fix sdcard fatfs test_apps format timeout		2023-05-25 08:52:59 +00:00
..
flash_ro	esp32h2: add build test	2023-01-17 10:29:04 +08:00
flash_wl	CI: sdcard tests fail fix	2023-05-10 16:48:03 +02:00
sdcard	CI: fix sdcard fatfs test_apps format timeout	2023-05-25 08:52:59 +00:00
test_fatfs_common	bugfix: fix for fatfs "open("xx",O_CREAT\|O_WRONLY,0666)" call failure	2023-04-18 09:57:44 +05:30
README.md	fatfs: add missing readme file for the test apps	2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

test functions
setup/teardown routines
build/test configurations
pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.