esp-idf/components/mbedtls/test
Marius Vikhammer fe71a8e340 aes/sha: use a shared lazy allocated GDMA channel for AES and SHA
Removed the old dynamically allocated GDMA channel approach.
It proved too unreliable as we couldn't not ensure consumers of the mbedtls
would properly free the channels after use.

Replaced by a single shared GDMA channel for AES and SHA, which won't be
released unless user specifically calls API for releasing it.
2021-03-09 09:23:05 +08:00
..
crts esp_crt_bundle: add additional unit tests 2020-12-08 10:11:31 +08:00
CMakeLists.txt esp_crt_bundle: add additional unit tests 2020-12-08 10:11:31 +08:00
component.mk
test_aes.c mbedtls tests: Add optional debug log output to AES stream tests 2021-02-12 04:08:12 +00:00
test_aes_gcm.c AES: refactor and add HAL layer 2020-12-10 09:04:47 +00:00
test_aes_perf.c AES/SHA: use GDMA driver instead of LL 2021-01-19 11:02:51 +08:00
test_aes_sha_parallel.c aes/sha: use a shared lazy allocated GDMA channel for AES and SHA 2021-03-09 09:23:05 +08:00
test_apb_dport_access.c
test_apb_dport_access.h
test_ecp.c
test_esp_crt_bundle.c AES: refactor and add HAL layer 2020-12-10 09:04:47 +00:00
test_mbedtls.c
test_mbedtls_mpi.c temporarily disable hardware encryption for esp32s3 2021-01-28 21:05:51 +08:00
test_mbedtls_sha.c AES/SHA: use GDMA driver instead of LL 2021-01-19 11:02:51 +08:00
test_rsa.c mbedtls: Fix rsa test 2021-03-02 03:18:58 +08:00
test_sha_perf.c unit_test: Refactor all performance tests that rely on cache compensated timer 2020-12-22 18:56:24 +11:00