esp-idf/components/esp32s2/test
Felipe Neves 2e826b7a8f intr_alloc: split interrupt allocator into common-code and platform-code
esp_system: removed repeated interrupt allocator code and moved common code to esp_system

xtens: moved xtensa specific code from freertos to the xtensa component

hal/interrupt_controller: added interrupt controller hal and ll files

docs: update the doxyfile with new location of esp_itr_alloc.h file

xtensa: fixed dangerous relocation problem after moving xtensa interrupt files out of freertos

docs: removed Xtensa reference from intr_allocator api-reference

xtensa: pushed the interrupt function that manages non iram interrupts to the xtensa layer

esp_system/test: fixed platform dependent setting for intr_allocator tests

hal: rename the functions used to manage non iram interrupt mask.
2020-09-30 07:44:12 +08:00
..
CMakeLists.txt NVS: using esp_partition API 2020-09-14 10:34:34 +08:00
component.mk
digital_signature_test_cases.h Digital Signature HW: adding S2 support 2020-04-01 13:47:13 +08:00
gen_digital_signature_tests.py Digital Signature HW: adding S2 support 2020-04-01 13:47:13 +08:00
test_ds.c esp_rom: extract common efuse apis into esp_rom_efuse.h 2020-07-15 10:40:50 +08:00
test_hmac.c esp_rom: extract common efuse apis into esp_rom_efuse.h 2020-07-15 10:40:50 +08:00
test_random.c esp32s2: add more unit test for esp32s2 2020-06-03 13:16:13 +08:00
test_sha.c esp32s2 sha test: update "Test esp_sha" to use cache compensated timer for performance measuring 2020-04-06 06:37:28 +00:00
test_spiram_cache_flush.c
test_stack_check.c
test_stack_check_cxx.cpp