esp-idf/components/fatfs/test
Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
CMakeLists.txt Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
component.mk
fatfs.img
test_fatfs_common.c fatfs: return EINVAL if truncate length is less than 0 2021-01-13 19:11:48 +08:00
test_fatfs_common.h Whitespace: Automated whitespace fixes (large commit) 2020-11-11 07:36:35 +00:00
test_fatfs_rawflash.c
test_fatfs_sdmmc.c vfs/fatfs: fix failed tests by increasing timeout 2021-08-25 19:04:34 +08:00
test_fatfs_spiflash.c