esp-idf/components/driver/test
Michael (XIAO Xufeng) 370a1fa6df Merge branch 'bugfix/fix_ci_about_touch_sensor_denoise_ut' into 'master'
driver(touch): fix touch sensor denoise unit test case

Closes IDF-1834 and TIDF-13311

See merge request espressif/esp-idf!9150
2020-07-02 11:22:42 +08:00
..
adc_dma_test driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
dac_dma_test driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
include/test driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
param_test
touch_sensor_test driver(touch): fix touch sensor denoise unit test case 2020-06-19 22:15:51 +08:00
CMakeLists.txt
component.mk
test_adc2_with_wifi.c
test_adc_common.c driver(adc): fix unit test for ADC-DMA (test_esp32s2.c); fix unit test for ADC-DMA (test_esp32s2.c); fix commit in adc dirver. 2020-06-01 15:00:08 +08:00
test_common_spi.c
test_dac.c
test_gpio.c
test_i2c.c
test_i2s.c driver(I2S): Fix i2s_comm_format_t configuration parameter does not match the TRM bug. 2020-05-18 19:55:30 +08:00
test_ledc.c
test_pcnt.c
test_pwm.c
test_rmt.c
test_rs485.c
test_rtcio.c
test_sdio.c
test_sdmmc_sdspi_init.cpp
test_sigmadelta.c
test_spi_bus_lock.c
test_spi_master.c
test_spi_param.c
test_spi_sio.c
test_spi_slave.c spi: re-enable the unit tests for esp32s2beta 2019-12-23 10:22:59 +08:00
test_timer.c bugfix(timer): improve timer unit test case 2020-06-15 16:12:51 +08:00
test_uart.c driver: make sure UART is idle before starting the test 2020-06-24 15:50:51 +02:00