esp-idf/components/driver/test_apps
Song Ruo Jing 5070e51dde ledc: Fix two bugs inside LEDC driver
1. Regression introduced when refactoring on clock sources selection (0d07f859).
   If channel configuration is called before timer configuration on C6, PWM signal may not be able to output.
2. Missing the improper fade parameter fix inside ledc_set_duty_and_update() function.
2023-04-06 12:37:33 +08:00
..
analog_comparator
components
dac_test_apps
gpio
gpio_extensions
gptimer
i2s_test_apps
ledc ledc: Fix two bugs inside LEDC driver 2023-04-06 12:37:33 +08:00
legacy_adc_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_mcpwm_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_pcnt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rmt_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
legacy_rtc_temp_driver
legacy_timer_driver ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
mcpwm ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
parlio
pulse_cnt
rmt rmt: calarify the meaning of mem_block_symbols in DMA and non-DMA mode 2023-03-30 11:09:13 +08:00
rs485
sdio
spi
temperature_sensor
touch_sensor_v1 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
touch_sensor_v2 ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
twai ci: update driver tests to use run_all_single_board_cases() 2023-03-28 17:05:50 +08:00
uart