esp-idf/components/fatfs
Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
diskio
port
src
test vfs/fatfs: fix failed tests by increasing timeout 2021-08-25 19:04:34 +08:00
test_fatfs_host
vfs
CMakeLists.txt
Kconfig
component.mk