esp-idf/components/driver/test_apps
laokaiyao b9e44b92b3 ci(i2s): enable i2s ci tests on p4 2024-01-19 19:28:33 +08:00
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components feat(sdio): sdio cross chip test app 2023-11-13 11:21:47 +08:00
dac_test_apps/legacy_dac_driver refactor(dac): make dac driver as component 2023-11-23 12:04:06 +08:00
i2s_test_apps ci(i2s): enable i2s ci tests on p4 2024-01-19 19:28:33 +08:00
legacy_adc_driver fix(adc): rename ADC_ATTEN_DB_11 to ADC_ATTEN_DB_12 2023-11-06 18:55:49 +08:00
legacy_i2c_driver fix(i2c): test app change gpio 2024-01-11 21:44:30 +08:00
legacy_mcpwm_driver fix(mcpwm): enable mcpwm group clock before hal init 2024-01-15 18:13:56 +08:00
legacy_pcnt_driver change(pcnt): reenable the target test for esp32p4 2024-01-10 23:03:40 +08:00
legacy_rmt_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_rtc_temp_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_sigma_delta_driver ci(p4): enable esp32p4 target test 2024-01-04 09:34:55 +08:00
legacy_timer_driver ci(p4): added todo jira for disabled tests on p4 2024-01-04 09:36:38 +08:00
touch_sensor_v1 driver:Trim the build components 2023-06-13 14:24:44 +08:00
touch_sensor_v2 fix(uart,usj...): Fix wrong serial number that has been parsed to rom functions, 2024-01-18 10:51:51 +08:00
twai fix(twai): enable twai interactive test for all targets on new std runner 2024-01-05 15:22:09 +08:00
.build-test-rules.yml feat(i2s): support i2s legacy driver on p4 2024-01-19 19:28:33 +08:00