Historia

Song Ruo Jing 2557e24a28 ci: Enable esp32c6 example, test_apps, and unit tests CI build stage		2022-11-01 11:23:21 +08:00
..
flash_ro	ci: Enable esp32c6 example, test_apps, and unit tests CI build stage	2022-11-01 11:23:21 +08:00
flash_wl	ci: Enable esp32c6 example, test_apps, and unit tests CI build stage	2022-11-01 11:23:21 +08:00
sdcard	fatfs: migrate unit tests to component test app, re-enable test for C2	2022-10-04 17:39:38 +02:00
test_fatfs_common	fatfs: migrate unit tests to component test app, re-enable test for C2	2022-10-04 17:39:38 +02:00
README.md	fatfs: add missing readme file for the test apps	2022-10-10 12:15:56 +02:00

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

test functions
setup/teardown routines
build/test configurations
pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.