esp-idf/components/driver/test
Ivan Grokhotkov 13d9c483b3 Merge branch 'bugfix/i2s_apll_clock_fix' into 'master'
driver/i2s: fix apll_clock_rate for different sample rates

See merge request idf/esp-idf!5159
2019-06-28 03:49:11 +08:00
..
include/test
param_test
CMakeLists.txt components: use new component registration api 2019-06-21 19:53:29 +08:00
component.mk
test_adc2.c
test_common_spi.c
test_gpio.c
test_i2c.c Merge branch 'bugfix/ticks_to_wait_for_uart_and_i2c' into 'master' 2019-06-11 08:41:44 +08:00
test_i2s.c i2s: test case for variation in apll clock rate 2019-06-20 16:40:58 +00:00
test_ledc.c
test_pcnt.c
test_pwm.c
test_rmt.c
test_sdmmc_sdspi_init.cpp
test_sigmadelta.c
test_spi_master.c spi: multichip support 2019-06-20 10:38:52 +08:00
test_spi_param.c
test_spi_sio.c
test_spi_slave.c
test_timer.c
test_uart.c driver: Add uart and i2c UTs to check ticks_to_wait in some functions 2019-06-05 10:38:23 +08:00