esp-idf/components/fatfs
Adam Múdry 4a6cc1d2a4 vfs/fatfs: fix failed tests by increasing timeout
Default 30s timeout is too low for a case when SD card formatting is triggered,
which could lead to tests failure. Timeout of tests is now set to 60s.

JIRA IDFCI-742
2021-08-25 19:04:34 +08:00
..
diskio
port
src fatfs: Fix some memory leak issues by coverity static analyzer. 2021-01-25 03:37:47 +00:00
test vfs/fatfs: fix failed tests by increasing timeout 2021-08-25 19:04:34 +08:00
test_fatfs_host host tests: add missing header files for compiling host tests 2021-07-20 17:44:20 +08:00
vfs fatfs: Fix some memory leak issues by coverity static analyzer. 2021-01-25 03:37:47 +00:00
CMakeLists.txt
Kconfig
component.mk