esp-idf/tools/ci
Michael (XIAO Xufeng) 1e1d50376b esp_flash: add unit test for external flash and QE toggling
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
2019-10-14 17:25:58 +08:00
..
config esp_flash: add unit test for external flash and QE toggling 2019-10-14 17:25:58 +08:00
apply_bot_filter.py
build_example_dirs.txt
build_examples.sh
build_examples_cmake.sh
check-executable.sh
check-line-endings.sh
check_artifacts_expire_time.py
check_deprecated_kconfigs.py
check_examples_cmake_make.sh
check_examples_rom_header.sh
check_idf_version.sh
check_ut_cmake_make.sh
checkout_project_ref.py
configure_ci_environment.sh
envsubst.py
executable-list.txt
fix_empty_prototypes.sh
get-full-sources.sh
get_supported_examples.sh
mirror-submodule-update.sh
multirun_with_pyenv.sh
push_to_github.sh
setup_python.sh
static-analysis-rules.yml
test_build_system.sh
test_build_system_cmake.sh
test_configure_ci_environment.sh