esp-idf/components/spi_flash/test
Michael (XIAO Xufeng) 1e1d50376b esp_flash: add unit test for external flash and QE toggling
Tests for external flash chips used to controlled by macros, one bin for
one chip. And tests are done manually. This commit refactored the test
so that all 3 chips can all run in single test.
2019-10-14 17:25:58 +08:00
..
CMakeLists.txt
component.mk
test_cache_disabled.c
test_esp_flash.c
test_flash_encryption.c
test_large_flash_writes.c
test_mmap.c
test_out_of_bounds_write.c
test_partition_ext.c
test_partitions.c
test_read_write.c
test_spi_flash.c