Historia

Cao Sen Miao 94120b82c2 esp32h2: add build test		2023-01-17 10:29:04 +08:00
..
flash_ro	esp32h2: add build test	2023-01-17 10:29:04 +08:00
flash_wl	esp32h2: add build test	2023-01-17 10:29:04 +08:00
sdcard	sdspi: bringup sdspi on c6	2022-12-19 16:33:50 +08:00
test_fatfs_common	…
README.md	…

README.md

fatfs component target tests

This directory contains tests for fatfs component which are run on chip targets.

See also test_fatfs_host directory for the tests which run on a Linux host.

Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:

sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash

These test apps define:

test functions
setup/teardown routines
build/test configurations
pytest test runners

The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.