esp-idf/components/driver/test
Jiang Jiang Jian 3d2700146e Merge branch 'bugfix/uart_no_int_after_flush_v4.4' into 'release/v4.4'
UART: RX interrupts are now properly restored after a flush (backport v4.4)

See merge request espressif/esp-idf!17122
2022-03-07 11:03:33 +08:00
..
adc_dma_test adc: support adc dma driver on all chips 2021-12-23 17:13:46 +08:00
dac_dma_test
include/test
param_test
touch_sensor_test
CMakeLists.txt
component.mk
test_adc.c adc: support adc dma driver on all chips 2021-12-23 17:13:46 +08:00
test_adc2_with_wifi.c adc: support adc dma driver on all chips 2021-12-23 17:13:46 +08:00
test_adc_common.c
test_common_spi.c
test_dac.c
test_dedicated_gpio.c
test_gdma.c
test_gpio.c gpio: Fix the bug that gpio interrupt cannot be triggered on app cpu on ESP32S3 2022-02-16 14:50:51 +08:00
test_i2c.c
test_i2s.c
test_ledc.c ledc: Fix FADE_NO_WAIT mode concurrency problem. 2022-02-16 15:02:45 +08:00
test_pcnt.c
test_pwm.c
test_rmt.c rmt: do not support rx wrap on esp32s2 2022-02-09 17:29:09 +08:00
test_rs485.c
test_rtcio.c
test_sdio.c
test_sdmmc_sdspi_init.cpp
test_sigmadelta.c
test_spi_bus_lock.c
test_spi_master.c
test_spi_param.c
test_spi_sio.c
test_spi_slave.c
test_spi_slave_hd.c spi-slave: fix single-board: hd test failing due to DMA buffers ending up in PSRAM 2021-12-08 10:59:26 +08:00
test_timer.c
test_uart.c Merge branch 'bugfix/uart_no_int_after_flush_v4.4' into 'release/v4.4' 2022-03-07 11:03:33 +08:00