kopia lustrzana https://github.com/espressif/esp-idf
25714837cf
Closes https://github.com/espressif/esp-idf/issues/12542 Co-authored-by: Tony Stuart <anthonyfstuart@gmail.com> |
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| .. | ||
| flash_ro | ||
| flash_wl | ||
| sdcard | ||
| test_fatfs_common | ||
| .build-test-rules.yml | ||
| README.md | ||
README.md
fatfs component target tests
This directory contains tests for fatfs component which are run on chip targets.
See also test_fatfs_host directory for the tests which run on a Linux host.
Fatfs tests can be executed with different diskio backends: diskio_sdmmc (SD cards over SD or SPI interface), diskio_spiflash (wear levelling in internal flash) and diskio_rawflash (read-only, no wear levelling, internal flash). There is one test app here for each of these backends:
- sdcard — runs fatfs tests with an SD card over SDMMC or SDSPI interface
- flash_wl - runs fatfs test in a wear_levelling partition in SPI flash
- flash_ro - runs fatfs test in a read-only (no wear levelling) partition in SPI flash
These test apps define:
- test functions
- setup/teardown routines
- build/test configurations
- pytest test runners
The actual test cases (many of which are common between the test apps) are defined in the test_fatfs_common component.