esp-idf

Autor	SHA1	Wiadomość	Data
Jan Brudný	58f79e6b00	driver: update copyright notice	2021-05-24 01:06:17 +02:00
Angus Gratton	5228d9f9ce	esp32c3: Apply one-liner/small changes for ESP32-C3	2020-12-01 10:58:50 +11:00
Angus Gratton	50aad77f3a	driver: Rename "local" tests to "single board" tests, add some description to the names	2019-12-12 11:05:04 +11:00
Anton Maklakov	75c0066f93	Fix remaining -Wstrict-prototypes warnings	2019-08-01 16:28:56 +07:00
michael	d9c5016e08	test: add new test framework for different configurations Paremeterized Test Framework ----------------------------- The SPI has a lot of parameters, which works in the same process. This framework provides a way to easily test different parameter sets. The framework can work in two different ways: - local test: which requires only one board to perform the test - master & slave test: which generates two sub test items which uses the same config set to cooperate to perform the test. The user defines a (pair if master/slave) set of init/deinit/loop functions. Then the test framework will call init once, then call loop several times with different configurations, then call deinit. Then a unit test can be appended by add a parameter group, and pass it into a macro.	2019-01-26 00:10:41 +08:00