esp-idf/components/driver/test/component.mk

#
#Component Makefile
#

COMPONENT_SRCDIRS += param_test touch_sensor_test adc_test
COMPONENT_PRIV_INCLUDEDIRS += param_test/include touch_sensor_test/include

COMPONENT_ADD_LDFLAGS = -Wl,--whole-archive -l$(COMPONENT_NAME) -Wl,--no-whole-archive
Add SPI Master driver, example, test and docs 2017-01-06 06:20:32 +00:00			`#`
			`#Component Makefile`
			`#`

driver(adc/dac): fix adc dac driver for esp32s2 1. update register file about adc; 2. fix adc driver; 3. add UT for adc/dac; See merge request espressif/esp-idf!7776 2020-02-25 14:19:48 +00:00			`COMPONENT_SRCDIRS += param_test touch_sensor_test adc_test`
driver(adc): fix adc io init bug; add unit test to check; 2020-04-08 13:56:14 +00:00			`COMPONENT_PRIV_INCLUDEDIRS += param_test/include touch_sensor_test/include`
test: add new test framework for different configurations Paremeterized Test Framework ----------------------------- The SPI has a lot of parameters, which works in the same process. This framework provides a way to easily test different parameter sets. The framework can work in two different ways: - local test: which requires only one board to perform the test - master & slave test: which generates two sub test items which uses the same config set to cooperate to perform the test. The user defines a (pair if master/slave) set of init/deinit/loop functions. Then the test framework will call init once, then call loop several times with different configurations, then call deinit. Then a unit test can be appended by add a parameter group, and pass it into a macro. 2018-06-26 08:23:39 +00:00
Add SPI Master driver, example, test and docs 2017-01-06 06:20:32 +00:00			`COMPONENT_ADD_LDFLAGS = -Wl,--whole-archive -l$(COMPONENT_NAME) -Wl,--no-whole-archive`